Industrial X-ray Inspection Systems

12.5 – 25 – 50 µm / TreFoc Technology

50 µm

Qualification of CR scanner systems

19 µm / Ultra-high resolution

76 µm / Compact & extremely robust

75 µm / Medium size for X-ray sources

76 µm / Medium size for gamma sources

99 µm / Extremely robust & wireless

99 µm / High-resolution & wireless

76 µm / Especially for high energies

200 µm / Shieldings up to 450 keV

DICONDE compliant

DICONDE compliant

For all NDT inspection methods

REACH compliant / BAM certified