X-ray Inspection Software for Aerospace Applications

Regular monitoring of the evaluation monitors using an SMPTE RP133 test pattern is a common requirement and ensures proper display of digital X-ray images. D-Tect X offers both a monitoring and a calibration function for this purpose. SMPTE images for all common monitor formats are stored in the software. During what is known as a monitor check, the tester is guided by instructions and the associated markings. The software logs the fact that a check has been carried out and the log can be exported for verification purposes. The time of the check including the test name and test decision, is traceable.

In applications with digital detector arrays, it is essential to calibrate the devices. One of the calibration steps is the regular creation and verification of a bad pixel map. D-Tect X is able to create a bad pixel map in accordance with the specifications of ASTM E 2597 and also offers a detailed statistical analysis. This involves itemizing all relevant bad pixels, bad clusters and bad lines with their numbers and exact positions on the active area and documenting these in a log. In addition, it is possible to fade in the relevant bad pixels in an X-ray image and to support the inspector, for example by ensuring that no cluster kernel pixels are found in the region of interest of the test object.

X-ray image of a weld seam, with bad pixels marked in red.

When evaluating X-ray images prior to arriving at an inspection decision, criteria such as security against manipulation and the use of standardized and comprehensible procedures for image operations and the saving of information in the image are very important. All such requirements are met by the D-Tect X software.

Each operation applied to the image is recorded in a history and can be individually activated as well as deactivated. The standardized DICONDE (.dcm) file format ensures that this history accompanies exported and imported images. This additionally ensures complete traceability of all changes.

Not only the image result and the operation steps up to the evaluation result, but also metadata such as X-ray and exposure parameters, image information such as resolution and exposure date, etc. are stored in the DICONDE format.

X-ray image with image operation history.

In fields of application where a uniform chain of image operations must be adhered to, these can be saved as presets and applied to further images with a single click. This supports the traceability and person-independent reproducibility of test results in sensitive test processes.

In addition to the stand-alone use of D-Tect X, if required it can be easily integrated into a network, so that work-sharing processes can be implemented. A connection to Picture Archiving and Communication Systems (PACS) is also possible.

D-Tect X also supports holistic NDT workflow management systems such as DRIVE NDT. In just a few steps, order and inspection data can be loaded from the management system into D-Tect X and immediately processed by the assigned inspector. The logging of inspection results subsequently takes place almost completely automatically with individually created report templates.

The scope of D-Tect X thus goes far beyond pure X-ray imaging, providing aerospace users with further essential tools and functions to enable and simplify inspection tasks to the highest of standards.